Reliability of MEMS : testing of materials and devices / / edited by Osamu Tabata, Toshiyuki Tsuchiya.

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Bibliographic Details
Superior document:Advanced micro & nanosystems
:
TeilnehmendeR:
Year of Publication:2013
Language:English
Series:Advanced micro & nanosystems.
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Physical Description:xx, 303 p. :; ill.
Notes:First edition 2007.
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