Next generation HALT and HASS : : robust design of electronics and systems / / Kirk Gray, John James Paschkewitz.
Saved in:
| Superior document: | Wiley series in quality and reliability engineering |
|---|---|
| VerfasserIn: | |
| TeilnehmendeR: | |
| Place / Publishing House: | Chichester, West Sussex, United Kingdom ;, Hoboken, NJ : : Wiley,, 2016. |
| Year of Publication: | 2016 |
| Language: | English |
| Series: | Wiley series in quality and reliability engineering.
|
| Online Access: | |
| Physical Description: | 1 online resource (299 pages) :; illustrations (some color) |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Table of Contents:
- Basis and limitations of typical current reliability methods & metrics
- The need for reliability assurance metrics to change
- Challenges to advancing electronics reliability engineering
- A new deterministic reliability development paradigm
- Common understanding of HALT approach is critical for success
- The fundamentals of HALT
- Highly accelerated stress screening (HALT) and audits (HASA)
- HALT benefits for software/firmware performance and reliability
- Quantitative accelerated life test
- Failure analysis and corrective action
- Additional applications of HALT methods.