Next generation HALT and HASS : : robust design of electronics and systems / / Kirk Gray, John James Paschkewitz.
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| Superior document: | Wiley series in quality and reliability engineering |
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| VerfasserIn: | |
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| Place / Publishing House: | Chichester, West Sussex, United Kingdom ;, Hoboken, NJ : : Wiley,, 2016. |
| Year of Publication: | 2016 |
| Language: | English |
| Series: | Wiley series in quality and reliability engineering.
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| Online Access: | |
| Physical Description: | 1 online resource (299 pages) :; illustrations (some color) |
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| Bibliography: | Includes bibliographical references and index. |
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| ISBN: | 9781118700235 (cloth) 9781118700228 9781118700204 |
| Hierarchical level: | Monograph |
| Statement of Responsibility: | Kirk Gray, John James Paschkewitz. |