Next generation HALT and HASS : : robust design of electronics and systems / / Kirk Gray, John James Paschkewitz.
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Superior document: | Wiley series in quality and reliability engineering |
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Place / Publishing House: | Chichester, West Sussex, United Kingdom ;, Hoboken, NJ : : Wiley,, 2016. |
Year of Publication: | 2016 |
Language: | English |
Series: | Wiley series in quality and reliability engineering.
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Online Access: | |
Physical Description: | 1 online resource (299 pages) :; illustrations (some color) |
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Bibliography: | Includes bibliographical references and index. |
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ISBN: | 9781118700235 (cloth) 9781118700228 9781118700204 |
Hierarchical level: | Monograph |
Statement of Responsibility: | Kirk Gray, John James Paschkewitz. |