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Next generation HALT and HASS : : robust design of electronics and systems /
Participants: Gray, Kirk, [ VerfasserIn ]; Paschkewitz, John James, [ VerfasserIn ]; Paschkewitz, John James, [ TeilnehmendeR ]
Published: 2016.
Superior document: Wiley series in quality and reliability engineering
Other Authors: “...Paschkewitz, John James,...”
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