Next generation HALT and HASS : : robust design of electronics and systems / / Kirk Gray, John James Paschkewitz.
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| Superior document: | Wiley series in quality and reliability engineering |
|---|---|
| VerfasserIn: | |
| TeilnehmendeR: | |
| Place / Publishing House: | Chichester, West Sussex, United Kingdom ;, Hoboken, NJ : : Wiley,, 2016. |
| Year of Publication: | 2016 |
| Language: | English |
| Series: | Wiley series in quality and reliability engineering.
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| Online Access: | |
| Physical Description: | 1 online resource (299 pages) :; illustrations (some color) |
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| 003 | MiAaPQ | ||
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| 007 | cr cnu|||||||| | ||
| 008 | 151207s2016 enkad ob 001 0 eng|d | ||
| 020 | |z 9781118700235 (cloth) | ||
| 020 | |z 9781118700228 | ||
| 020 | |a 9781118700204 |q (electronic bk.) | ||
| 035 | |a (MiAaPQ)5004451897 | ||
| 035 | |a (Au-PeEL)EBL4451897 | ||
| 035 | |a (CaPaEBR)ebr11172310 | ||
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| 035 | |a (OCoLC)933211556 | ||
| 040 | |a MiAaPQ |b eng |e rda |e pn |c MiAaPQ |d MiAaPQ | ||
| 050 | 4 | |a TA169.3 |b .G73 2016 | |
| 082 | 0 | |a 621.381028/7 |2 23 | |
| 100 | 1 | |a Gray, Kirk, |e author. | |
| 245 | 1 | 0 | |a Next generation HALT and HASS : |b robust design of electronics and systems / |c Kirk Gray, John James Paschkewitz. |
| 264 | 1 | |a Chichester, West Sussex, United Kingdom ; |a Hoboken, NJ : |b Wiley, |c 2016. | |
| 300 | |a 1 online resource (299 pages) : |b illustrations (some color) | ||
| 336 | |a text |2 rdacontent | ||
| 337 | |a computer |2 rdamedia | ||
| 338 | |a online resource |2 rdacarrier | ||
| 490 | 1 | |a Wiley series in quality and reliability engineering | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods. | |
| 588 | |a Description based on print version record. | ||
| 590 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | |a Accelerated life testing. | |
| 650 | 0 | |a Electronic systems |x Design and construction. | |
| 650 | 0 | |a Electronic systems |x Testing. | |
| 655 | 4 | |a Electronic books. | |
| 700 | 1 | |a Paschkewitz, John James, |e author. | |
| 776 | 0 | 8 | |i Print version: |a Gray, Kirk. |t Next generation HALT and HASS : robust design of electronics and systems. |d Chichester, West Sussex, United Kingdom : Wiley, 2016 |k Wiley series in quality and reliability engineering |z 9781118700228 |
| 797 | 2 | |a ProQuest (Firm) | |
| 830 | 0 | |a Wiley series in quality and reliability engineering. | |
| 856 | 4 | 0 | |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4451897 |z Click to View |