Next generation HALT and HASS : : robust design of electronics and systems /

Next generation HALT and HASS : : robust design of electronics and systems / / Kirk Gray, John James Paschkewitz.

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Superior document:Wiley series in quality and reliability engineering
VerfasserIn:
Gray, Kirk,
Paschkewitz, John James,
TeilnehmendeR:
Paschkewitz, John James,
Place / Publishing House:Chichester, West Sussex, United Kingdom ;, Hoboken, NJ : : Wiley,, 2016.
Year of Publication:2016
Language:English
Series:Wiley series in quality and reliability engineering.
Online Access:
Physical Description:1 online resource (299 pages) :; illustrations (some color)
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ctrlnum (MiAaPQ)5004451897
(Au-PeEL)EBL4451897
(CaPaEBR)ebr11172310
(CaONFJC)MIL909295
(OCoLC)933211556
collection bib_alma
record_format marc
spelling Gray, Kirk, author.
Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz.
Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.
1 online resource (299 pages) : illustrations (some color)
text rdacontent
computer rdamedia
online resource rdacarrier
Wiley series in quality and reliability engineering
Includes bibliographical references and index.
Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods.
Description based on print version record.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Accelerated life testing.
Electronic systems Design and construction.
Electronic systems Testing.
Electronic books.
Paschkewitz, John James, author.
Print version: Gray, Kirk. Next generation HALT and HASS : robust design of electronics and systems. Chichester, West Sussex, United Kingdom : Wiley, 2016 Wiley series in quality and reliability engineering 9781118700228
ProQuest (Firm)
Wiley series in quality and reliability engineering.
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4451897 Click to View
language English
format eBook
author Gray, Kirk,
Paschkewitz, John James,
spellingShingle Gray, Kirk,
Paschkewitz, John James,
Next generation HALT and HASS : robust design of electronics and systems /
Wiley series in quality and reliability engineering
Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods.
author_facet Gray, Kirk,
Paschkewitz, John James,
Paschkewitz, John James,
author_variant k g kg
j j p jj jjp
author_role VerfasserIn
VerfasserIn
author2 Paschkewitz, John James,
author2_role TeilnehmendeR
author_sort Gray, Kirk,
title Next generation HALT and HASS : robust design of electronics and systems /
title_sub robust design of electronics and systems /
title_full Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz.
title_fullStr Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz.
title_full_unstemmed Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz.
title_auth Next generation HALT and HASS : robust design of electronics and systems /
title_new Next generation HALT and HASS :
title_sort next generation halt and hass : robust design of electronics and systems /
series Wiley series in quality and reliability engineering
series2 Wiley series in quality and reliability engineering
publisher Wiley,
publishDate 2016
physical 1 online resource (299 pages) : illustrations (some color)
contents Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods.
isbn 9781118700204
9781118700228
callnumber-first T - Technology
callnumber-subject TA - General and Civil Engineering
callnumber-label TA169
callnumber-sort TA 3169.3 G73 42016
genre Electronic books.
genre_facet Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4451897
illustrated Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 621 - Applied physics
dewey-full 621.381028/7
dewey-sort 3621.381028 17
dewey-raw 621.381028/7
dewey-search 621.381028/7
oclc_num 933211556
work_keys_str_mv AT graykirk nextgenerationhaltandhassrobustdesignofelectronicsandsystems
AT paschkewitzjohnjames nextgenerationhaltandhassrobustdesignofelectronicsandsystems
status_str n
ids_txt_mv (MiAaPQ)5004451897
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hierarchy_parent_title Wiley series in quality and reliability engineering
is_hierarchy_title Next generation HALT and HASS : robust design of electronics and systems /
container_title Wiley series in quality and reliability engineering
author2_original_writing_str_mv noLinkedField
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