On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.
The demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a cru...
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| Place / Publishing House: | Aalborg : : River Publishers,, 2019. ©2019. |
| Year of Publication: | 2019 |
| Edition: | 1st ed. |
| Language: | English |
| Online Access: | |
| Physical Description: | 1 online resource (278 pages) |
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