On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.
The demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a cru...
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| Place / Publishing House: | Aalborg : : River Publishers,, 2019. ©2019. |
| Year of Publication: | 2019 |
| Edition: | 1st ed. |
| Language: | English |
| Online Access: | |
| Physical Description: | 1 online resource (278 pages) |
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| 082 | 0 | |a 621.38152 | |
| 100 | 1 | |a Rumiantsev, Andrej. | |
| 245 | 1 | 0 | |a On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond. |
| 250 | |a 1st ed. | ||
| 264 | 1 | |a Aalborg : |b River Publishers, |c 2019. | |
| 264 | 4 | |c ©2019. | |
| 300 | |a 1 online resource (278 pages) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 520 | |a The demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug. This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies. | ||
| 588 | |a Description based on publisher supplied metadata and other sources. | ||
| 590 | |a Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2024. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries. | ||
| 655 | 4 | |a Electronic books. | |
| 776 | 0 | 8 | |i Print version: |a Rumiantsev, Andrej |t On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond |d Aalborg : River Publishers,c2019 |
| 797 | 2 | |a ProQuest (Firm) | |
| 856 | 4 | 0 | |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=30251765 |z Click to View |