On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.

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The demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a cru...

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Rumiantsev, Andrej.
Place / Publishing House:Aalborg : : River Publishers,, 2019.
©2019.
Year of Publication:2019
Edition:1st ed.
Language:English
Online Access:
Physical Description:1 online resource (278 pages)
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(OCoLC)1369665925
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spelling Rumiantsev, Andrej.
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.
1st ed.
Aalborg : River Publishers, 2019.
©2019.
1 online resource (278 pages)
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
The demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug.  This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.
Description based on publisher supplied metadata and other sources.
Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2024. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.
Electronic books.
Print version: Rumiantsev, Andrej On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond Aalborg : River Publishers,c2019
ProQuest (Firm)
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=30251765 Click to View
language English
format eBook
author Rumiantsev, Andrej.
spellingShingle Rumiantsev, Andrej.
On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.
author_facet Rumiantsev, Andrej.
author_variant a r ar
author_sort Rumiantsev, Andrej.
title On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.
title_full On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.
title_fullStr On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.
title_full_unstemmed On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.
title_auth On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.
title_new On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.
title_sort on-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond.
publisher River Publishers,
publishDate 2019
physical 1 online resource (278 pages)
edition 1st ed.
isbn 9788770221115
genre Electronic books.
genre_facet Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=30251765
illustrated Not Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 621 - Applied physics
dewey-full 621.38152
dewey-sort 3621.38152
dewey-raw 621.38152
dewey-search 621.38152
oclc_num 1369665925
work_keys_str_mv AT rumiantsevandrej onwafercalibrationtechniquesenablingaccuratecharacterizationofhighperformancesilicondevicesatthemmwaverangeandbeyond
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ids_txt_mv (MiAaPQ)50030251765
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is_hierarchy_title On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.
marc_error Info : MARC8 translation shorter than ISO-8859-1, choosing MARC8. --- [ 856 : z ]
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