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On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / / Andrej Rumiantsev.

Participants: Rumiantsev, Andrej, [ VerfasserIn ]
Published: [2019]
Superior document: River publishers series in electronic materials and devices

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On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond.

Participants: Rumiantsev, Andrej. [ ]
Published: 2019.

Links: Get full text