Fringe pattern analysis for optical metrology : : theory, algorithms, and applications / / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
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| Place / Publishing House: | Weinheim, Germany : : Wiley-VCH Verlag GmbH & Co. KGaA,, 2014. 2014 |
| Year of Publication: | 2014 |
| Language: | English |
| Online Access: | |
| Physical Description: | 1 online resource (345 pages) :; illustrations |
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