Fringe pattern analysis for optical metrology : : theory, algorithms, and applications / / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.

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Place / Publishing House:Weinheim, Germany : : Wiley-VCH Verlag GmbH & Co. KGaA,, 2014.
2014
Year of Publication:2014
Language:English
Online Access:
Physical Description:1 online resource (345 pages) :; illustrations
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020 |a 9783527681082  |q (electronic bk.) 
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035 |a (Au-PeEL)EBL1701414 
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050 4 |a QC415  |b .S478 2014 
082 0 |a 621.36  |2 23 
100 1 |a Servin, Manuel,  |e author. 
245 1 0 |a Fringe pattern analysis for optical metrology :  |b theory, algorithms, and applications /  |c Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. 
264 1 |a Weinheim, Germany :  |b Wiley-VCH Verlag GmbH & Co. KGaA,  |c 2014. 
264 4 |c 2014 
300 |a 1 online resource (345 pages) :  |b illustrations 
336 |a text  |2 rdacontent 
337 |a computer  |2 rdamedia 
338 |a online resource  |2 rdacarrier 
504 |a Includes bibliographical references and index. 
588 |a Description based on online resource; title from PDF title page (ebrary, viewed June 19, 2014). 
590 |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
650 0 |a Diffraction patterns  |x Data processing. 
650 0 |a Image processing  |x Data processing. 
655 4 |a Electronic books. 
700 1 |a Quiroga, J. Antonio,  |e author. 
700 1 |a Padilla, J. Moises,  |e author. 
776 0 8 |i Print version:  |a Servin, Manuel.  |t Fringe pattern analysis for optical metrology : theory, algorithms, and applications.  |d Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, c2014   |h xvi, 327 pages   |z 9783527411528 
797 2 |a ProQuest (Firm) 
856 4 0 |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1701414  |z Click to View