Fringe pattern analysis for optical metrology : : theory, algorithms, and applications / / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
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Place / Publishing House: | Weinheim, Germany : : Wiley-VCH Verlag GmbH & Co. KGaA,, 2014. 2014 |
Year of Publication: | 2014 |
Language: | English |
Online Access: | |
Physical Description: | 1 online resource (345 pages) :; illustrations |
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Bibliography: | Includes bibliographical references and index. |
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ISBN: | 9783527411528 9783527681099 (Mobi) 9783527681075 (oBook) 9783527681082 9783527681105 |
Hierarchical level: | Monograph |
Statement of Responsibility: | Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. |