Fringe pattern analysis for optical metrology : : theory, algorithms, and applications /

Fringe pattern analysis for optical metrology : : theory, algorithms, and applications / / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.

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Bibliographic Details
VerfasserIn:
Servin, Manuel,
Quiroga, J. Antonio,
Padilla, J. Moises,
TeilnehmendeR:
Quiroga, J. Antonio,
Padilla, J. Moises,
Place / Publishing House:Weinheim, Germany : : Wiley-VCH Verlag GmbH & Co. KGaA,, 2014.
2014
Year of Publication:2014
Language:English
Online Access:
Physical Description:1 online resource (345 pages) :; illustrations
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Description
Bibliography:Includes bibliographical references and index.
ISBN:9783527411528
9783527681099 (Mobi)
9783527681075 (oBook)
9783527681082
9783527681105
Hierarchical level:Monograph
Statement of Responsibility: Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.

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