Fringe pattern analysis for optical metrology : : theory, algorithms, and applications / / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
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| Place / Publishing House: | Weinheim, Germany : : Wiley-VCH Verlag GmbH & Co. KGaA,, 2014. 2014 |
| Year of Publication: | 2014 |
| Language: | English |
| Online Access: | |
| Physical Description: | 1 online resource (345 pages) :; illustrations |
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5001701414 |
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(MiAaPQ)5001701414 (Au-PeEL)EBL1701414 (CaPaEBR)ebr10881255 (CaONFJC)MIL615339 (OCoLC)881028799 |
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Servin, Manuel, author. Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014. 2014 1 online resource (345 pages) : illustrations text rdacontent computer rdamedia online resource rdacarrier Includes bibliographical references and index. Description based on online resource; title from PDF title page (ebrary, viewed June 19, 2014). Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Diffraction patterns Data processing. Image processing Data processing. Electronic books. Quiroga, J. Antonio, author. Padilla, J. Moises, author. Print version: Servin, Manuel. Fringe pattern analysis for optical metrology : theory, algorithms, and applications. Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, c2014 xvi, 327 pages 9783527411528 ProQuest (Firm) https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1701414 Click to View |
| language |
English |
| format |
eBook |
| author |
Servin, Manuel, Quiroga, J. Antonio, Padilla, J. Moises, |
| spellingShingle |
Servin, Manuel, Quiroga, J. Antonio, Padilla, J. Moises, Fringe pattern analysis for optical metrology : theory, algorithms, and applications / |
| author_facet |
Servin, Manuel, Quiroga, J. Antonio, Padilla, J. Moises, Quiroga, J. Antonio, Padilla, J. Moises, |
| author_variant |
m s ms j a q ja jaq j m p jm jmp |
| author_role |
VerfasserIn VerfasserIn VerfasserIn |
| author2 |
Quiroga, J. Antonio, Padilla, J. Moises, |
| author2_role |
TeilnehmendeR TeilnehmendeR |
| author_sort |
Servin, Manuel, |
| title |
Fringe pattern analysis for optical metrology : theory, algorithms, and applications / |
| title_sub |
theory, algorithms, and applications / |
| title_full |
Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. |
| title_fullStr |
Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. |
| title_full_unstemmed |
Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla. |
| title_auth |
Fringe pattern analysis for optical metrology : theory, algorithms, and applications / |
| title_new |
Fringe pattern analysis for optical metrology : |
| title_sort |
fringe pattern analysis for optical metrology : theory, algorithms, and applications / |
| publisher |
Wiley-VCH Verlag GmbH & Co. KGaA, |
| publishDate |
2014 |
| physical |
1 online resource (345 pages) : illustrations |
| isbn |
9783527681082 9783527681105 9783527411528 |
| callnumber-first |
Q - Science |
| callnumber-subject |
QC - Physics |
| callnumber-label |
QC415 |
| callnumber-sort |
QC 3415 S478 42014 |
| genre |
Electronic books. |
| genre_facet |
Electronic books. |
| url |
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1701414 |
| illustrated |
Illustrated |
| dewey-hundreds |
600 - Technology |
| dewey-tens |
620 - Engineering |
| dewey-ones |
621 - Applied physics |
| dewey-full |
621.36 |
| dewey-sort |
3621.36 |
| dewey-raw |
621.36 |
| dewey-search |
621.36 |
| oclc_num |
881028799 |
| work_keys_str_mv |
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n |
| ids_txt_mv |
(MiAaPQ)5001701414 (Au-PeEL)EBL1701414 (CaPaEBR)ebr10881255 (CaONFJC)MIL615339 (OCoLC)881028799 |
| is_hierarchy_title |
Fringe pattern analysis for optical metrology : theory, algorithms, and applications / |
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noLinkedField noLinkedField |
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1792330788316905472 |
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