Failure Analysis : : High Technology Devices / / Daniel J. D. Sullivan, Eric J. Carleton.
The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
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| Superior document: | Title is part of eBook package: De Gruyter DG Plus DeG Package 2022 Part 1 |
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| VerfasserIn: | |
| Place / Publishing House: | Berlin ;, Boston : : De Gruyter, , [2022] ©2022 |
| Year of Publication: | 2022 |
| Language: | English |
| Series: | De Gruyter STEM
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| Online Access: | |
| Physical Description: | 1 online resource (VIII, 120 p.) |
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