Failure Analysis : : High Technology Devices / / Daniel J. D. Sullivan, Eric J. Carleton.

• Superior document: Title is part of eBook package: De Gruyter DG Plus DeG Package 2022 Part 1
• VerfasserIn: Sullivan, Daniel J. D.,; Carleton, Eric J.,
• Place / Publishing House: Berlin ;, Boston : : De Gruyter, , [2022]; ©2022
• Year of Publication: 2022
• Language: English
• Series: De Gruyter STEM
• Physical Description: 1 online resource (VIII, 120 p.)
• Other title: Frontmatter --; Contents --; Chapter 1 Introduction to FA --; Chapter 2 Why is FA important? --; Chapter 3 Planning out an FA --; Chapter 4 Typical types of failure mechanisms --; Chapter 5 Destructive versus nondestructive analysis --; Chapter 6 Optical Microscopy (OM) --; Chapter 7 Scanning Acoustic Microscopy/Tomography (SAM or SAT) --; Chapter 8 X-ray imaging (2D and 3D) --; Chapter 9 Time Domain Reflectometry (TDR) --; Chapter 10 Selecting the path before destructive analysis begins --; Chapter 11 Destructive work --; Chapter 12 Electrical Failure Analysis (EFA) --; Chapter 13 EMMI/OBIRCH/IR --; Chapter 14 Cross sections (X-sections) --; Chapter 15 Parallel lapping (p-lap) --; Chapter 16 Focused Ion Beam (FIB) --; Chapter 17 Scanning Electron Microscopy (SEM) --; Chapter 18 Transmission Electron Microscopy (TEM) --; Chapter 19 Energy Dispersive X-ray spectroscopy (EDX) --; Chapter 20 Use of additional materials analytical techniques and processes --; Chapter 21 How should these results be used? --; References --; Appendix --; List of figures --; Index
• Format: Mode of access: Internet via World Wide Web.
• ISBN: 9781501524790; 9783110766820; 9783110993899; 9783110994810; 9783110993448; 9783110993219
• DOI: 10.1515/9781501524790
• Access: restricted access
• Hierarchical level: Monograph
• Statement of Responsibility: Daniel J. D. Sullivan, Eric J. Carleton.

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.