Failure Analysis : : High Technology Devices /

Failure Analysis : : High Technology Devices / / Daniel J. D. Sullivan, Eric J. Carleton.

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

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Bibliographic Details
Superior document:Title is part of eBook package: De Gruyter DG Plus DeG Package 2022 Part 1
VerfasserIn:
Sullivan, Daniel J. D.,
Carleton, Eric J.,
Place / Publishing House:Berlin ;, Boston : : De Gruyter, , [2022]
©2022
Year of Publication:2022
Language:English
Series:De Gruyter STEM
Online Access:
Physical Description:1 online resource (VIII, 120 p.)
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505 0 0 |t Frontmatter --   |t Contents --   |t Chapter 1 Introduction to FA --   |t Chapter 2 Why is FA important? --   |t Chapter 3 Planning out an FA --   |t Chapter 4 Typical types of failure mechanisms --   |t Chapter 5 Destructive versus nondestructive analysis --   |t Chapter 6 Optical Microscopy (OM) --   |t Chapter 7 Scanning Acoustic Microscopy/Tomography (SAM or SAT) --   |t Chapter 8 X-ray imaging (2D and 3D) --   |t Chapter 9 Time Domain Reflectometry (TDR) --   |t Chapter 10 Selecting the path before destructive analysis begins --   |t Chapter 11 Destructive work --   |t Chapter 12 Electrical Failure Analysis (EFA) --   |t Chapter 13 EMMI/OBIRCH/IR --   |t Chapter 14 Cross sections (X-sections) --   |t Chapter 15 Parallel lapping (p-lap) --   |t Chapter 16 Focused Ion Beam (FIB) --   |t Chapter 17 Scanning Electron Microscopy (SEM) --   |t Chapter 18 Transmission Electron Microscopy (TEM) --   |t Chapter 19 Energy Dispersive X-ray spectroscopy (EDX) --   |t Chapter 20 Use of additional materials analytical techniques and processes --   |t Chapter 21 How should these results be used? --   |t References --   |t Appendix --   |t List of figures --   |t Index 
506 0 |a restricted access  |u http://purl.org/coar/access_right/c_16ec  |f online access with authorization  |2 star 
520 |a The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies. 
530 |a Issued also in print. 
538 |a Mode of access: Internet via World Wide Web. 
546 |a In English. 
588 0 |a Description based on online resource; title from PDF title page (publisher's Web site, viewed 29. Mai 2023) 
650 7 |a Technology & Engineering / Materials Science / General.  |2 bisacsh 
653 |a Analytical Techniques. 
653 |a Failure Analysis. 
653 |a High Technology Devices. 
700 1 |a Carleton, Eric J.,   |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
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