Dark count rate of silicon photomultipliers : : metrological characterization and suppression / / Eugen Engelmann.
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Place / Publishing House: | Gottingen : : Cuvillier,, 2018. |
Year of Publication: | 2018 |
Edition: | 1. Auflage. |
Language: | English |
Online Access: | |
Physical Description: | 1 online resource (195 pages) |
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