Dark count rate of silicon photomultipliers : : metrological characterization and suppression / / Eugen Engelmann.
Saved in:
VerfasserIn: | |
---|---|
Place / Publishing House: | Gottingen : : Cuvillier,, 2018. |
Year of Publication: | 2018 |
Edition: | 1. Auflage. |
Language: | English |
Online Access: | |
Physical Description: | 1 online resource (195 pages) |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
id |
5005574462 |
---|---|
ctrlnum |
(MiAaPQ)5005574462 (Au-PeEL)EBL5574462 (OCoLC)1066182781 |
collection |
bib_alma |
record_format |
marc |
spelling |
Engelmann, Eugen, author. Dark count rate of silicon photomultipliers : metrological characterization and suppression / Eugen Engelmann. 1. Auflage. Gottingen : Cuvillier, 2018. 1 online resource (195 pages) text txt rdacontent computer c rdamedia online resource cr rdacarrier Description based on print version record. Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Photoelectric multipliers. Optoelectronic devices. Electronic books. Print version: Engelmann, Eugen. Dark count rate of silicon photomultipliers : metrological characterization and suppression 1. Auflage. Gottingen : Cuvillier Verlag, 2018 195 pages 9783736998926 ProQuest (Firm) https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=5574462 Click to View |
language |
English |
format |
eBook |
author |
Engelmann, Eugen, |
spellingShingle |
Engelmann, Eugen, Dark count rate of silicon photomultipliers : metrological characterization and suppression / |
author_facet |
Engelmann, Eugen, |
author_variant |
e e ee |
author_role |
VerfasserIn |
author_sort |
Engelmann, Eugen, |
title |
Dark count rate of silicon photomultipliers : metrological characterization and suppression / |
title_sub |
metrological characterization and suppression / |
title_full |
Dark count rate of silicon photomultipliers : metrological characterization and suppression / Eugen Engelmann. |
title_fullStr |
Dark count rate of silicon photomultipliers : metrological characterization and suppression / Eugen Engelmann. |
title_full_unstemmed |
Dark count rate of silicon photomultipliers : metrological characterization and suppression / Eugen Engelmann. |
title_auth |
Dark count rate of silicon photomultipliers : metrological characterization and suppression / |
title_new |
Dark count rate of silicon photomultipliers : |
title_sort |
dark count rate of silicon photomultipliers : metrological characterization and suppression / |
publisher |
Cuvillier, |
publishDate |
2018 |
physical |
1 online resource (195 pages) |
edition |
1. Auflage. |
isbn |
9783736988927 (e-book) 9783736998926 |
callnumber-first |
T - Technology |
callnumber-subject |
TA - General and Civil Engineering |
callnumber-label |
TA1750 |
callnumber-sort |
TA 41750 E544 42018 |
genre |
Electronic books. |
genre_facet |
Electronic books. |
url |
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=5574462 |
illustrated |
Not Illustrated |
dewey-hundreds |
600 - Technology |
dewey-tens |
620 - Engineering |
dewey-ones |
621 - Applied physics |
dewey-full |
621.381045 |
dewey-sort |
3621.381045 |
dewey-raw |
621.381045 |
dewey-search |
621.381045 |
oclc_num |
1066182781 |
work_keys_str_mv |
AT engelmanneugen darkcountrateofsiliconphotomultipliersmetrologicalcharacterizationandsuppression |
status_str |
n |
ids_txt_mv |
(MiAaPQ)5005574462 (Au-PeEL)EBL5574462 (OCoLC)1066182781 |
carrierType_str_mv |
cr |
is_hierarchy_title |
Dark count rate of silicon photomultipliers : metrological characterization and suppression / |
_version_ |
1792330995156910081 |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01609nam a2200385 i 4500</leader><controlfield tag="001">5005574462</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cnu||||||||</controlfield><controlfield tag="008">181214s2018 xx o 000 0 eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9783736998926</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783736988927 (e-book)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)5005574462</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL5574462</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1066182781</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="b">eng</subfield><subfield code="e">rda</subfield><subfield code="e">pn</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TA1750</subfield><subfield code="b">.E544 2018</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381045</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Engelmann, Eugen,</subfield><subfield code="e">author.</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Dark count rate of silicon photomultipliers :</subfield><subfield code="b">metrological characterization and suppression /</subfield><subfield code="c">Eugen Engelmann.</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1. Auflage.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Gottingen :</subfield><subfield code="b">Cuvillier,</subfield><subfield code="c">2018.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (195 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="588" ind1=" " ind2=" "><subfield code="a">Description based on print version record.</subfield></datafield><datafield tag="590" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Photoelectric multipliers.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Optoelectronic devices.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Print version:</subfield><subfield code="a">Engelmann, Eugen.</subfield><subfield code="t">Dark count rate of silicon photomultipliers : metrological characterization and suppression</subfield><subfield code="b">1. Auflage.</subfield><subfield code="d">Gottingen : Cuvillier Verlag, 2018 </subfield><subfield code="h">195 pages </subfield><subfield code="z">9783736998926</subfield></datafield><datafield tag="797" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=5574462</subfield><subfield code="z">Click to View</subfield></datafield></record></collection> |