Dark count rate of silicon photomultipliers : : metrological characterization and suppression / / Eugen Engelmann.

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Place / Publishing House:Gottingen : : Cuvillier,, 2018.
Year of Publication:2018
Edition:1. Auflage.
Language:English
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Physical Description:1 online resource (195 pages)
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ISBN:9783736998926
9783736988927 (ebook)
Hierarchical level:Monograph
Statement of Responsibility: Eugen Engelmann.