Dark count rate of silicon photomultipliers : : metrological characterization and suppression /

Dark count rate of silicon photomultipliers : : metrological characterization and suppression / / Eugen Engelmann.

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Engelmann, Eugen,
Place / Publishing House:Gottingen : : Cuvillier,, 2018.
Year of Publication:2018
Edition:1. Auflage.
Language:English
Online Access:
Physical Description:1 online resource (195 pages)
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100 1 |a Engelmann, Eugen,  |e author. 
245 1 0 |a Dark count rate of silicon photomultipliers :  |b metrological characterization and suppression /  |c Eugen Engelmann. 
250 |a 1. Auflage. 
264 1 |a Gottingen :  |b Cuvillier,  |c 2018. 
300 |a 1 online resource (195 pages) 
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338 |a online resource  |b cr  |2 rdacarrier 
588 |a Description based on print version record. 
590 |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2018. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. 
650 0 |a Photoelectric multipliers. 
650 0 |a Optoelectronic devices. 
655 4 |a Electronic books. 
776 0 8 |i Print version:  |a Engelmann, Eugen.  |t Dark count rate of silicon photomultipliers : metrological characterization and suppression  |b 1. Auflage.  |d Gottingen : Cuvillier Verlag, 2018   |h 195 pages   |z 9783736998926 
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