Conductive atomic force microscopy : : applications in nanomaterials / / edited by Mario Lanza.
Saved in:
| TeilnehmendeR: | |
|---|---|
| Place / Publishing House: | Weinheim, Germany : : Wiley-VCH,, 2017. 2017 |
| Year of Publication: | 2017 |
| Language: | English |
| Online Access: | |
| Physical Description: | 1 online resource (99 pages) |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|