Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization / / edited by Chandra Shakher Pathak and Samir Kumar.

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, i...

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Bibliographic Details
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Place / Publishing House:London : : IntechOpen,, 2022.
©2022
Year of Publication:2022
Language:English
Physical Description:1 online resource (xi, 274 pages) :; illustrations
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