Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization / / edited by Chandra Shakher Pathak and Samir Kumar.
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, i...
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Place / Publishing House: | London : : IntechOpen,, 2022. ©2022 |
Year of Publication: | 2022 |
Language: | English |
Physical Description: | 1 online resource (xi, 274 pages) :; illustrations |
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