Conductive atomic force microscopy : : applications in nanomaterials / / edited by Mario Lanza.
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| TeilnehmendeR: | |
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| Place / Publishing House: | Weinheim, Germany : : Wiley-VCH,, 2017. 2017 |
| Year of Publication: | 2017 |
| Language: | English |
| Online Access: | |
| Physical Description: | 1 online resource (99 pages) |
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5004939442 |
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(MiAaPQ)5004939442 (Au-PeEL)EBL4939442 (CaPaEBR)ebr11422579 (CaONFJC)MIL1026779 (OCoLC)1001380043 |
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Conductive atomic force microscopy : applications in nanomaterials / edited by Mario Lanza. Weinheim, Germany : Wiley-VCH, 2017. 2017 1 online resource (99 pages) text rdacontent computer rdamedia online resource rdacarrier Includes bibliographical references at the end of each chapters and index. Description based on online resource; title from PDF title page (ebrary, viewed August 30, 2017). Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Atomic force microscopy. Electronic books. Lanza, Mario, editor. Print version: Conductive atomic force microscopy : applications in nanomaterials. Weinheim, Germany : Wiley-VCH, c2017 approximately 99 pages 9783527340910 ProQuest (Firm) https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4939442 Click to View |
| language |
English |
| format |
eBook |
| author2 |
Lanza, Mario, |
| author_facet |
Lanza, Mario, |
| author2_variant |
m l ml |
| author2_role |
TeilnehmendeR |
| title |
Conductive atomic force microscopy : applications in nanomaterials / |
| spellingShingle |
Conductive atomic force microscopy : applications in nanomaterials / |
| title_sub |
applications in nanomaterials / |
| title_full |
Conductive atomic force microscopy : applications in nanomaterials / edited by Mario Lanza. |
| title_fullStr |
Conductive atomic force microscopy : applications in nanomaterials / edited by Mario Lanza. |
| title_full_unstemmed |
Conductive atomic force microscopy : applications in nanomaterials / edited by Mario Lanza. |
| title_auth |
Conductive atomic force microscopy : applications in nanomaterials / |
| title_new |
Conductive atomic force microscopy : |
| title_sort |
conductive atomic force microscopy : applications in nanomaterials / |
| publisher |
Wiley-VCH, |
| publishDate |
2017 |
| physical |
1 online resource (99 pages) |
| isbn |
9783527699797 9783527340910 |
| callnumber-first |
Q - Science |
| callnumber-subject |
QH - Natural History and Biology |
| callnumber-label |
QH212 |
| callnumber-sort |
QH 3212 A78 C663 42017 |
| genre |
Electronic books. |
| genre_facet |
Electronic books. |
| url |
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4939442 |
| illustrated |
Not Illustrated |
| dewey-hundreds |
500 - Science |
| dewey-tens |
500 - Science |
| dewey-ones |
502 - Miscellany |
| dewey-full |
502.82 |
| dewey-sort |
3502.82 |
| dewey-raw |
502.82 |
| dewey-search |
502.82 |
| oclc_num |
1001380043 |
| work_keys_str_mv |
AT lanzamario conductiveatomicforcemicroscopyapplicationsinnanomaterials |
| status_str |
n |
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(MiAaPQ)5004939442 (Au-PeEL)EBL4939442 (CaPaEBR)ebr11422579 (CaONFJC)MIL1026779 (OCoLC)1001380043 |
| is_hierarchy_title |
Conductive atomic force microscopy : applications in nanomaterials / |
| author2_original_writing_str_mv |
noLinkedField |
| _version_ |
1792330957351550976 |
| fullrecord |
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