Conductive atomic force microscopy : : applications in nanomaterials / / edited by Mario Lanza.
Saved in:
TeilnehmendeR: | |
---|---|
Place / Publishing House: | Weinheim, Germany : : Wiley-VCH,, 2017. 2017 |
Year of Publication: | 2017 |
Language: | English |
Online Access: | |
Physical Description: | 1 online resource (99 pages) |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
id |
5004939442 |
---|---|
ctrlnum |
(MiAaPQ)5004939442 (Au-PeEL)EBL4939442 (CaPaEBR)ebr11422579 (CaONFJC)MIL1026779 (OCoLC)1001380043 |
collection |
bib_alma |
record_format |
marc |
spelling |
Conductive atomic force microscopy : applications in nanomaterials / edited by Mario Lanza. Weinheim, Germany : Wiley-VCH, 2017. 2017 1 online resource (99 pages) text rdacontent computer rdamedia online resource rdacarrier Includes bibliographical references at the end of each chapters and index. Description based on online resource; title from PDF title page (ebrary, viewed August 30, 2017). Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Atomic force microscopy. Electronic books. Lanza, Mario, editor. Print version: Conductive atomic force microscopy : applications in nanomaterials. Weinheim, Germany : Wiley-VCH, c2017 approximately 99 pages 9783527340910 ProQuest (Firm) https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4939442 Click to View |
language |
English |
format |
eBook |
author2 |
Lanza, Mario, |
author_facet |
Lanza, Mario, |
author2_variant |
m l ml |
author2_role |
TeilnehmendeR |
title |
Conductive atomic force microscopy : applications in nanomaterials / |
spellingShingle |
Conductive atomic force microscopy : applications in nanomaterials / |
title_sub |
applications in nanomaterials / |
title_full |
Conductive atomic force microscopy : applications in nanomaterials / edited by Mario Lanza. |
title_fullStr |
Conductive atomic force microscopy : applications in nanomaterials / edited by Mario Lanza. |
title_full_unstemmed |
Conductive atomic force microscopy : applications in nanomaterials / edited by Mario Lanza. |
title_auth |
Conductive atomic force microscopy : applications in nanomaterials / |
title_new |
Conductive atomic force microscopy : |
title_sort |
conductive atomic force microscopy : applications in nanomaterials / |
publisher |
Wiley-VCH, |
publishDate |
2017 |
physical |
1 online resource (99 pages) |
isbn |
9783527699797 9783527340910 |
callnumber-first |
Q - Science |
callnumber-subject |
QH - Natural History and Biology |
callnumber-label |
QH212 |
callnumber-sort |
QH 3212 A78 C663 42017 |
genre |
Electronic books. |
genre_facet |
Electronic books. |
url |
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4939442 |
illustrated |
Not Illustrated |
dewey-hundreds |
500 - Science |
dewey-tens |
500 - Science |
dewey-ones |
502 - Miscellany |
dewey-full |
502.82 |
dewey-sort |
3502.82 |
dewey-raw |
502.82 |
dewey-search |
502.82 |
oclc_num |
1001380043 |
work_keys_str_mv |
AT lanzamario conductiveatomicforcemicroscopyapplicationsinnanomaterials |
status_str |
n |
ids_txt_mv |
(MiAaPQ)5004939442 (Au-PeEL)EBL4939442 (CaPaEBR)ebr11422579 (CaONFJC)MIL1026779 (OCoLC)1001380043 |
is_hierarchy_title |
Conductive atomic force microscopy : applications in nanomaterials / |
author2_original_writing_str_mv |
noLinkedField |
_version_ |
1792330957351550976 |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01718nam a2200409 i 4500</leader><controlfield tag="001">5004939442</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cnu||||||||</controlfield><controlfield tag="008">170830t20172017gw ob 001 0 eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9783527340910</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783527699797</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)5004939442</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL4939442</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr11422579</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaONFJC)MIL1026779</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1001380043</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="b">eng</subfield><subfield code="e">rda</subfield><subfield code="e">pn</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">QH212.A78</subfield><subfield code="b">.C663 2017</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502.82</subfield><subfield code="2">23</subfield></datafield><datafield tag="245" ind1="0" ind2="0"><subfield code="a">Conductive atomic force microscopy :</subfield><subfield code="b">applications in nanomaterials /</subfield><subfield code="c">edited by Mario Lanza.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Weinheim, Germany :</subfield><subfield code="b">Wiley-VCH,</subfield><subfield code="c">2017.</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">2017</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (99 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references at the end of each chapters and index.</subfield></datafield><datafield tag="588" ind1=" " ind2=" "><subfield code="a">Description based on online resource; title from PDF title page (ebrary, viewed August 30, 2017).</subfield></datafield><datafield tag="590" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Atomic force microscopy.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Lanza, Mario,</subfield><subfield code="e">editor.</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Print version:</subfield><subfield code="t">Conductive atomic force microscopy : applications in nanomaterials.</subfield><subfield code="d">Weinheim, Germany : Wiley-VCH, c2017 </subfield><subfield code="h">approximately 99 pages </subfield><subfield code="z">9783527340910</subfield></datafield><datafield tag="797" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4939442</subfield><subfield code="z">Click to View</subfield></datafield></record></collection> |