Scanning Probe Microscopy : : Physical Property Characterization at Nanoscale / / edited by Vijay Nalladega.
Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization...
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| Place / Publishing House: | Rijeka, Croatia : : IntechOpen,, 2012. |
| Year of Publication: | 2012 |
| Language: | English |
| Physical Description: | 1 online resource (xi, 256 pages) :; illustrations |
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Electronic
| DOAB Directory of Open Access Books | Available |