Scanning Probe Microscopy : : Physical Property Characterization at Nanoscale / / edited by Vijay Nalladega.
Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization...
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| Place / Publishing House: | Rijeka, Croatia : : IntechOpen,, 2012. |
| Year of Publication: | 2012 |
| Language: | English |
| Physical Description: | 1 online resource (xi, 256 pages) :; illustrations |
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| LEADER | 01070nam a2200289 i 4500 | ||
|---|---|---|---|
| 001 | 993545223504498 | ||
| 005 | 20221016201012.0 | ||
| 006 | m o d | ||
| 007 | cr ||||||||||| | ||
| 008 | 221016s2012 ci a ob 000 0 eng d | ||
| 020 | |a 953-51-4998-9 | ||
| 035 | |a (CKB)4970000000098133 | ||
| 035 | |a (NjHacI)994970000000098133 | ||
| 035 | |a (oapen)https://directory.doabooks.org/handle/20.500.12854/66051 | ||
| 035 | |a (EXLCZ)994970000000098133 | ||
| 040 | |a NjHacI |b eng |e rda |c NjHacl | ||
| 041 | 0 | |a eng | |
| 050 | 4 | |a QH212.S34 |b .S336 2012 | |
| 082 | 0 | 4 | |a 502.8 |2 23 |
| 100 | 1 | |a Nalladega, Vijay |4 edt | |
| 245 | 0 | 0 | |a Scanning Probe Microscopy : |b Physical Property Characterization at Nanoscale / |c edited by Vijay Nalladega. |
| 246 | |a Scanning probe microscopy | ||
| 260 | |b IntechOpen |c 2012 | ||
| 264 | 1 | |a Rijeka, Croatia : |b IntechOpen, |c 2012. | |
| 300 | |a 1 online resource (xi, 256 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 588 | |a Description based on: online resource; title from PDF information screen (IntechOpen, viewed October 16, 2022). | ||
| 504 | |a Includes bibliographical references. | ||
| 520 | |a Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy. | ||
| 546 | |a English | ||
| 650 | 0 | |a Scanning transmission electron microscopy. | |
| 653 | |a Electrochemistry & magnetochemistry | ||
| 776 | |z 953-51-0576-0 | ||
| 700 | 1 | |a Nalladega, Vijay, |e editor. | |
| 906 | |a BOOK | ||
| ADM | |b 2023-02-22 03:37:03 Europe/Vienna |f system |c marc21 |a 2019-04-13 22:04:18 Europe/Vienna |g false | ||
| AVE | |i DOAB Directory of Open Access Books |P DOAB Directory of Open Access Books |x https://eu02.alma.exlibrisgroup.com/view/uresolver/43ACC_OEAW/openurl?u.ignore_date_coverage=true&portfolio_pid=5337879540004498&Force_direct=true |Z 5337879540004498 |b Available |8 5337879540004498 | ||