ISTFA 2011 : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA / / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.
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| Year of Publication: | 2011 |
| Language: | English |
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| Physical Description: | xix, 456 p. :; col. ill. |
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