ISTFA 2011 : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA / / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.

Saved in:
Bibliographic Details
:
TeilnehmendeR:
Year of Publication:2011
Language:English
Online Access:
Physical Description:xix, 456 p. :; col. ill.
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Bibliography:Includes bibliographical references and index.
ISBN:0615038263
9781615038268
9781615038503 (electronic bk.)
Hierarchical level:Monograph
Statement of Responsibility: sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.