ISTFA 2011 : conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA / / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International.
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| Year of Publication: | 2011 |
| Language: | English |
| Online Access: | |
| Physical Description: | xix, 456 p. :; col. ill. |
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| LEADER | 01685nam a2200361 a 4500 | ||
|---|---|---|---|
| 001 | 5003002459 | ||
| 003 | MiAaPQ | ||
| 005 | 20200520144314.0 | ||
| 006 | m o d | | ||
| 007 | cr cn||||||||| | ||
| 008 | 120330s2011 ohua sb 101 0 eng d | ||
| 020 | |z 0615038263 | ||
| 020 | |z 9781615038268 | ||
| 020 | |a 9781615038503 (electronic bk.) | ||
| 035 | |a (MiAaPQ)5003002459 | ||
| 035 | |a (Au-PeEL)EBL3002459 | ||
| 035 | |a (CaPaEBR)ebr10540844 | ||
| 035 | |a (OCoLC)929147929 | ||
| 040 | |a MiAaPQ |c MiAaPQ |d MiAaPQ | ||
| 050 | 4 | |a TK7871 |b .I58 2011 | |
| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (37th : |d 2011 : |c San Jose, Calif.) | |
| 245 | 1 | 0 | |a ISTFA 2011 |h [electronic resource] : |b conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA / |c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2009, ASM International. |
| 260 | |a Materials Park, Ohio : |b ASM International, |c 2011. | ||
| 300 | |a xix, 456 p. : |b col. ill. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 533 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 655 | 4 | |a Electronic books. | |
| 710 | 2 | |a ASM International. | |
| 710 | 2 | |a Electronic Device Failure Analysis Society. | |
| 710 | 2 | |a ProQuest (Firm) | |
| 856 | 4 | 0 | |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=3002459 |z Click to View |