Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability / / editor, D.J. Dumin.
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Superior document: | Selected topics in electronics and systems ; v. 23 |
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TeilnehmendeR: | |
Year of Publication: | 2002 |
Language: | English |
Series: | Selected topics in electronics and systems ;
v. 23. |
Online Access: | |
Physical Description: | ix, 270 p. :; ill. |
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