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Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability /
Participants: ProQuest (Firm) [ ]; Dumin, D. J. [ TeilnehmendeR ]; ProQuest (Firm) [ TeilnehmendeR ]
Published: c2002.
Superior document: Selected topics in electronics and systems ; v. 23
Other Authors: “...Dumin, D. J....”
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