Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability / / editor, D.J. Dumin.
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| Superior document: | Selected topics in electronics and systems ; v. 23 |
|---|---|
| : | |
| TeilnehmendeR: | |
| Year of Publication: | 2002 |
| Language: | English |
| Series: | Selected topics in electronics and systems ;
v. 23. |
| Online Access: | |
| Physical Description: | ix, 270 p. :; ill. |
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| 245 | 0 | 0 | |a Oxide reliability |h [electronic resource] : |b a summary of silicon oxide wearout, breakdown, and reliability / |c editor, D.J. Dumin. |
| 260 | |a [River Edge, NJ] : |b World Scientific, |c c2002. | ||
| 300 | |a ix, 270 p. : |b ill. | ||
| 490 | 1 | |a Selected topics in electronics and systems ; |v v. 23 | |
| 504 | |a Includes bibliographical references. | ||
| 533 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | |a Metal oxide semiconductors |x Reliability. | |
| 650 | 0 | |a Silicon oxide |x Deterioration. | |
| 655 | 4 | |a Electronic books. | |
| 700 | 1 | |a Dumin, D. J. | |
| 710 | 2 | |a ProQuest (Firm) | |
| 830 | 0 | |a Selected topics in electronics and systems ; |v v. 23. | |
| 856 | 4 | 0 | |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1679439 |z Click to View |