Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability /

Oxide reliability : a summary of silicon oxide wearout, breakdown, and reliability / / editor, D.J. Dumin.

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Superior document:Selected topics in electronics and systems ; v. 23
:
ProQuest (Firm)
TeilnehmendeR:
Dumin, D. J.
ProQuest (Firm)
Year of Publication:2002
Language:English
Series:Selected topics in electronics and systems ; v. 23.
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Physical Description:ix, 270 p. :; ill.
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record_format marc
spelling Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.
[River Edge, NJ] : World Scientific, c2002.
ix, 270 p. : ill.
Selected topics in electronics and systems ; v. 23
Includes bibliographical references.
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Metal oxide semiconductors Reliability.
Silicon oxide Deterioration.
Electronic books.
Dumin, D. J.
ProQuest (Firm)
Selected topics in electronics and systems ; v. 23.
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1679439 Click to View
language English
format Electronic
eBook
author2 Dumin, D. J.
ProQuest (Firm)
author_facet Dumin, D. J.
ProQuest (Firm)
ProQuest (Firm)
author2_variant d j d dj djd
author2_role TeilnehmendeR
TeilnehmendeR
author_corporate ProQuest (Firm)
author_sort Dumin, D. J.
title Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /
spellingShingle Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /
Selected topics in electronics and systems ;
title_sub a summary of silicon oxide wearout, breakdown, and reliability /
title_full Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.
title_fullStr Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.
title_full_unstemmed Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.
title_auth Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /
title_new Oxide reliability
title_sort oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /
series Selected topics in electronics and systems ;
series2 Selected topics in electronics and systems ;
publisher World Scientific,
publishDate 2002
physical ix, 270 p. : ill.
callnumber-first T - Technology
callnumber-subject TK - Electrical and Nuclear Engineering
callnumber-label TK7871
callnumber-sort TK 47871.99 M44 O95 42002
genre Electronic books.
genre_facet Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=1679439
illustrated Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 621 - Applied physics
dewey-full 621.39/732
dewey-sort 3621.39 3732
dewey-raw 621.39/732
dewey-search 621.39/732
oclc_num 879074114
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hierarchy_parent_title Selected topics in electronics and systems ; v. 23
hierarchy_sequence v. 23.
is_hierarchy_title Oxide reliability a summary of silicon oxide wearout, breakdown, and reliability /
container_title Selected topics in electronics and systems ; v. 23
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