Capacitance cell measurement of the Out-of-Plane expansion of thin films

Capacitance cell measurement of the Out-of-Plane expansion of thin films / Chad R. Snyder, Frederick I. Mopsik

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Superior document:NIST special publication 960-7 : NIST recommended practice guide
VerfasserIn:
Snyder, Chad R.
Mopsik, Frederick I.
Place / Publishing House:Washington, DC, 2001
Year of Publication:2001
Language:English
Series:NIST special publication 960-7 : NIST recommended practice guide
Physical Description:32 S.; graph. Darst.
Notes:Literaturverz. S. 31 - 32
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spelling Snyder, Chad R. aut
Capacitance cell measurement of the Out-of-Plane expansion of thin films Chad R. Snyder, Frederick I. Mopsik
Washington, DC 2001
32 S. graph. Darst.
NIST special publication 960-7 : NIST recommended practice guide
Literaturverz. S. 31 - 32
Mopsik, Frederick I. aut
(AT-OBV)AC00350863 960-7
YWOAW MAG2-1 100317.960,1 2214299040004498
language English
format Book
author Snyder, Chad R.
Mopsik, Frederick I.
spellingShingle Snyder, Chad R.
Mopsik, Frederick I.
Capacitance cell measurement of the Out-of-Plane expansion of thin films
NIST special publication
author_facet Snyder, Chad R.
Mopsik, Frederick I.
Mopsik, Frederick I.
author_variant c r s cr crs
f i m fi fim
author_role VerfasserIn
VerfasserIn
author2 Mopsik, Frederick I.
author2_role VerfasserIn
author_sort Snyder, Chad R.
title Capacitance cell measurement of the Out-of-Plane expansion of thin films
title_full Capacitance cell measurement of the Out-of-Plane expansion of thin films Chad R. Snyder, Frederick I. Mopsik
title_fullStr Capacitance cell measurement of the Out-of-Plane expansion of thin films Chad R. Snyder, Frederick I. Mopsik
title_full_unstemmed Capacitance cell measurement of the Out-of-Plane expansion of thin films Chad R. Snyder, Frederick I. Mopsik
title_auth Capacitance cell measurement of the Out-of-Plane expansion of thin films
title_new Capacitance cell measurement of the Out-of-Plane expansion of thin films
title_sort capacitance cell measurement of the out-of-plane expansion of thin films
series NIST special publication
series2 NIST special publication
publishDate 2001
physical 32 S. graph. Darst.
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