Selective interface toughness measurements of layered thin films / R. Konetschnik, R. Daniel, R. Brunner, and D. Kiener
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| Superior document: | Enthalten in AIP Advances Melville : AIP Publishing, 2017 7 (2017) |
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| VerfasserIn: | |
| Place / Publishing House: | 2017 |
| Year of Publication: | 2017 |
| Language: | English |
| Online Access: | |
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| Open Access Artikel Verlag der Österreichischen Akademie der Wissenschaften | Available |