Capacitance cell measurement of the Out-of-Plane expansion of thin films / Chad R. Snyder, Frederick I. Mopsik
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| Superior document: | NIST special publication 960-7 : NIST recommended practice guide |
|---|---|
| VerfasserIn: | |
| Place / Publishing House: | Washington, DC, 2001 |
| Year of Publication: | 2001 |
| Language: | English |
| Series: | NIST special publication
960-7 : NIST recommended practice guide |
| Physical Description: | 32 S.; graph. Darst. |
| Notes: | Literaturverz. S. 31 - 32 |
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OeAW BAS:IS (Library, Archiv, Collections)
| Location: | BASIS-Journals TSP |
| Call Numbers: | 100317.960,1 |
| Call Number | 2nd Call Number | Description | Location | Remarks | Status | Availability | Order |
|---|---|---|---|---|---|---|---|
| 100317.960,1 | BASIS-Journals TSP | Loan | Available | Place a Hold |