Capacitance cell measurement of the Out-of-Plane expansion of thin films / Chad R. Snyder, Frederick I. Mopsik
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Superior document: | NIST special publication 960-7 : NIST recommended practice guide |
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VerfasserIn: | |
Place / Publishing House: | Washington, DC, 2001 |
Year of Publication: | 2001 |
Language: | English |
Series: | NIST special publication
960-7 : NIST recommended practice guide |
Physical Description: | 32 S.; graph. Darst. |
Notes: | Literaturverz. S. 31 - 32 |
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