Semiconductor measurement technology : workshop on mass flow measurement and control for the semiconductor industry / Robert F. Berg ...
Salvato in:
| Superior document: | NIST special publications 400-101 |
|---|---|
| HerausgeberIn: | |
| Place / Publishing House: | Washington, DC, 2001 |
| Anno di pubblicazione: | 2001 |
| Lingua: | English |
| Serie: | NIST special publications
400-101 |
| Descrizione fisica: | IV, 86 S.; Ill., graph. Darst.; 28 cm |
| Tags: |
Aggiungi Tag
Nessun Tag, puoi essere il primo ad aggiungerne! !
|
Copie
OeAW BAS:IS (Library, Archiv, Collections)
| Location: | BASIS-Journals TSP |
| Call Numbers: | 100317.400/101 |
| Call Number | 2nd Call Number | Descrizione | Localizzazione | Remarks | Status | Availability | Order |
|---|---|---|---|---|---|---|---|
| 100317.400/101 | BASIS-Journals TSP | Loan | Disponibile | Richiedi |