Semiconductor measurement technology : workshop on mass flow measurement and control for the semiconductor industry / Robert F. Berg ...
Gorde:
Superior document: | NIST special publications 400-101 |
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HerausgeberIn: | |
Place / Publishing House: | Washington, DC, 2001 |
Argitaratze-urtea: | 2001 |
Hizkuntza: | English |
Saila: | NIST special publications
400-101 |
Deskribapen fisikoa: | IV, 86 S.; Ill., graph. Darst.; 28 cm |
Etiketak: |
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Kopiak
OeAW BAS:IS (Library, Archiv, Collections)
Location: | BASIS-Journals TSP |
Call Numbers: | 100317.400/101 |
Call Number | 2nd Call Number | Deskribapena | Kokapena | Remarks | Egoera | Availability | Order |
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100317.400/101 | BASIS-Journals TSP | Loan | Eskuragarri | Erreserbatu |