Electromigration in ULSI interconnections / Cher Ming Tan.
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Superior document: | International series on advances in solid state electronics and technology (ASSET) |
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TeilnehmendeR: | |
Year of Publication: | 2010 |
Language: | English |
Series: | International series on advances in solid state electronics and technology.
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Online Access: | |
Physical Description: | xix, 291 p. :; ill. (some col.), col. port. |
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