VLSI test principles and architectures : design for testability / / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
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| Superior document: | The Morgan Kaufmann series in systems on silicon |
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| TeilnehmendeR: | |
| Year of Publication: | 2006 |
| Language: | English |
| Series: | Morgan Kaufmann series in systems on silicon.
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| Online Access: | |
| Physical Description: | xxx, 777 p. :; ill. ;; 25 cm. |
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| Bibliography: | Includes bibliographical references and index. |
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| ISBN: | 0123705975 (hardcover : alk. paper) 9780123705976 |
| Hierarchical level: | Monograph |
| Statement of Responsibility: | edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. |