VLSI test principles and architectures : design for testability / / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
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Superior document: | The Morgan Kaufmann series in systems on silicon |
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TeilnehmendeR: | |
Year of Publication: | 2006 |
Language: | English |
Series: | Morgan Kaufmann series in systems on silicon.
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Online Access: | |
Physical Description: | xxx, 777 p. :; ill. ;; 25 cm. |
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Bibliography: | Includes bibliographical references and index. |
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ISBN: | 0123705975 (hardcover : alk. paper) 9780123705976 |
Hierarchical level: | Monograph |
Statement of Responsibility: | edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. |