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VLSI test principles and architectures : design for testability / / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

Participants: Wang, Laung-Terng. [ TeilnehmendeR ]; Wu, Cheng-Wen, EE Ph. D. [ TeilnehmendeR ]; Wen, Xiaoqing. [ TeilnehmendeR ]
Published: c2006.
Superior document: The Morgan Kaufmann series in systems on silicon

Other Authors: “...Wu, Cheng-Wen, EE Ph. D....”

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