Electromigration in ULSI interconnections / Cher Ming Tan.

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Bibliographic Details
Superior document:International series on advances in solid state electronics and technology (ASSET)
:
TeilnehmendeR:
Year of Publication:2010
Language:English
Series:International series on advances in solid state electronics and technology.
Online Access:
Physical Description:xix, 291 p. :; ill. (some col.), col. port.
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Description
Bibliography:Includes bibliographical references and index.
ISBN:9814273325
9789814273329
9789814273336 (electronic bk.)
Hierarchical level:Monograph
Statement of Responsibility: Cher Ming Tan.