Electromigration in ULSI interconnections / Cher Ming Tan.
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Superior document: | International series on advances in solid state electronics and technology (ASSET) |
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Year of Publication: | 2010 |
Language: | English |
Series: | International series on advances in solid state electronics and technology.
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Physical Description: | xix, 291 p. :; ill. (some col.), col. port. |
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500731200 |
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Tan, Cher Ming, 1959- Electromigration in ULSI interconnections [electronic resource] / Cher Ming Tan. Hackensack, N.J. : World Scientific, c2010. xix, 291 p. : ill. (some col.), col. port. International series on advances in solid state electronics and technology (ASSET) Includes bibliographical references and index. Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. Integrated circuits Ultra large scale integration. Electrodiffusion. Electronic books. ProQuest (Firm) International series on advances in solid state electronics and technology. https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=731200 Click to View |
language |
English |
format |
Electronic eBook |
author |
Tan, Cher Ming, 1959- |
spellingShingle |
Tan, Cher Ming, 1959- Electromigration in ULSI interconnections International series on advances in solid state electronics and technology (ASSET) |
author_facet |
Tan, Cher Ming, 1959- ProQuest (Firm) ProQuest (Firm) |
author_variant |
c m t cm cmt |
author2 |
ProQuest (Firm) |
author2_role |
TeilnehmendeR |
author_corporate |
ProQuest (Firm) |
author_sort |
Tan, Cher Ming, 1959- |
title |
Electromigration in ULSI interconnections |
title_full |
Electromigration in ULSI interconnections [electronic resource] / Cher Ming Tan. |
title_fullStr |
Electromigration in ULSI interconnections [electronic resource] / Cher Ming Tan. |
title_full_unstemmed |
Electromigration in ULSI interconnections [electronic resource] / Cher Ming Tan. |
title_auth |
Electromigration in ULSI interconnections |
title_new |
Electromigration in ULSI interconnections |
title_sort |
electromigration in ulsi interconnections |
series |
International series on advances in solid state electronics and technology (ASSET) |
series2 |
International series on advances in solid state electronics and technology (ASSET) |
publisher |
World Scientific, |
publishDate |
2010 |
physical |
xix, 291 p. : ill. (some col.), col. port. |
isbn |
9789814273336 (electronic bk.) |
callnumber-first |
T - Technology |
callnumber-subject |
TK - Electrical and Nuclear Engineering |
callnumber-label |
TK7874 |
callnumber-sort |
TK 47874.76 T36 42010 |
genre |
Electronic books. |
genre_facet |
Electronic books. |
url |
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=731200 |
illustrated |
Illustrated |
oclc_num |
714877548 |
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AT tancherming electromigrationinulsiinterconnections AT proquestfirm electromigrationinulsiinterconnections |
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(MiAaPQ)500731200 (Au-PeEL)EBL731200 (CaPaEBR)ebr10480052 (CaONFJC)MIL314371 (OCoLC)714877548 |
hierarchy_parent_title |
International series on advances in solid state electronics and technology (ASSET) |
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Electromigration in ULSI interconnections |
container_title |
International series on advances in solid state electronics and technology (ASSET) |
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