ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / / organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International.

Saved in:
Bibliographic Details
:
TeilnehmendeR:
Place / Publishing House:Materials Park, Ohio : : ASM International,, [2015]
2015
Year of Publication:2015
Language:English
Online Access:
Physical Description:1 online resource (536 pages) :; illustrations (some color)
Notes:Cover title.
Tags: Add Tag
No Tags, Be the first to tag this record!
id 5004392496
ctrlnum (MiAaPQ)5004392496
(Au-PeEL)EBL4392496
(CaPaEBR)ebr11160634
(OCoLC)940934393
collection bib_alma
record_format marc
spelling International Symposium for Testing and Failure Analysis (41st : 2015 : Portland, Oregon), organizer.
ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International.
Materials Park, Ohio : ASM International, [2015]
2015
1 online resource (536 pages) : illustrations (some color)
text rdacontent
computer rdamedia
online resource rdacarrier
Cover title.
Description based on online resource; title from PDF title page (ebrary, viewed March 14, 2016).
Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Electronics Materials Testing Congresses.
Materials Testing Congresses.
Electronic apparatus and appliances Testing Congresses.
Semiconductors Testing Congresses.
Electronic books.
ASM International, organizer.
Electronic Device Failure Analysis Society, organizer.
ProQuest (Firm)
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4392496 Click to View
language English
format Conference Proceeding
eBook
author2 ASM International,
Electronic Device Failure Analysis Society,
author_facet ASM International,
Electronic Device Failure Analysis Society,
International Symposium for Testing and Failure Analysis Portland, Oregon),
author2_role TeilnehmendeR
TeilnehmendeR
author_corporate International Symposium for Testing and Failure Analysis Portland, Oregon),
author_sort International Symposium for Testing and Failure Analysis Portland, Oregon),
title ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
spellingShingle ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
title_sub November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
title_full ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International.
title_fullStr ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International.
title_full_unstemmed ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International.
title_auth ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
title_new ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis :
title_sort istfa 2015 conference proceedings from the 41st international symposium for testing and failure analysis : november 1-5 2015, oregon convention center, portland, oregon, usa /
publisher ASM International,
publishDate 2015
physical 1 online resource (536 pages) : illustrations (some color)
isbn 9781627081030
callnumber-first T - Technology
callnumber-subject TK - Electrical and Nuclear Engineering
callnumber-label TK7871
callnumber-sort TK 47871 A86 42015
genre Electronic books.
genre_facet Congresses.
Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4392496
illustrated Illustrated
oclc_num 940934393
work_keys_str_mv AT internationalsymposiumfortestingandfailureanalysisportlandoregon istfa2015conferenceproceedingsfromthe41stinternationalsymposiumfortestingandfailureanalysisnovember152015oregonconventioncenterportlandoregonusa
AT asminternational istfa2015conferenceproceedingsfromthe41stinternationalsymposiumfortestingandfailureanalysisnovember152015oregonconventioncenterportlandoregonusa
AT electronicdevicefailureanalysissociety istfa2015conferenceproceedingsfromthe41stinternationalsymposiumfortestingandfailureanalysisnovember152015oregonconventioncenterportlandoregonusa
status_str n
ids_txt_mv (MiAaPQ)5004392496
(Au-PeEL)EBL4392496
(CaPaEBR)ebr11160634
(OCoLC)940934393
is_hierarchy_title ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
author2_original_writing_str_mv noLinkedField
noLinkedField
_version_ 1792330900355153920
fullrecord <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02028nam a2200433 i 4500</leader><controlfield tag="001">5004392496</controlfield><controlfield tag="003">MiAaPQ</controlfield><controlfield tag="005">20200520144314.0</controlfield><controlfield tag="006">m o d | </controlfield><controlfield tag="007">cr cnu||||||||</controlfield><controlfield tag="008">160314t20152015ohua o 100 0 eng|d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9781627081023</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781627081030</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(MiAaPQ)5004392496</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(Au-PeEL)EBL4392496</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(CaPaEBR)ebr11160634</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)940934393</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">MiAaPQ</subfield><subfield code="b">eng</subfield><subfield code="e">rda</subfield><subfield code="e">pn</subfield><subfield code="c">MiAaPQ</subfield><subfield code="d">MiAaPQ</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TK7871</subfield><subfield code="b">.A86 2015</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Symposium for Testing and Failure Analysis</subfield><subfield code="n">(41st :</subfield><subfield code="d">2015 :</subfield><subfield code="c">Portland, Oregon),</subfield><subfield code="j">organizer.</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis :</subfield><subfield code="b">November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /</subfield><subfield code="c">organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Materials Park, Ohio :</subfield><subfield code="b">ASM International,</subfield><subfield code="c">[2015]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">2015</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (536 pages) :</subfield><subfield code="b">illustrations (some color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Cover title.</subfield></datafield><datafield tag="588" ind1=" " ind2=" "><subfield code="a">Description based on online resource; title from PDF title page (ebrary, viewed March 14, 2016).</subfield></datafield><datafield tag="590" ind1=" " ind2=" "><subfield code="a">Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Electronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Semiconductors</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ASM International,</subfield><subfield code="e">organizer.</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Electronic Device Failure Analysis Society,</subfield><subfield code="e">organizer.</subfield></datafield><datafield tag="797" ind1="2" ind2=" "><subfield code="a">ProQuest (Firm)</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4392496</subfield><subfield code="z">Click to View</subfield></datafield></record></collection>