ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / / organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International.
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| TeilnehmendeR: | |
| Place / Publishing House: | Materials Park, Ohio : : ASM International,, [2015] 2015 |
| Year of Publication: | 2015 |
| Language: | English |
| Online Access: | |
| Physical Description: | 1 online resource (536 pages) :; illustrations (some color) |
| Notes: | Cover title. |
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| 003 | MiAaPQ | ||
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| 008 | 160314t20152015ohua o 100 0 eng|d | ||
| 020 | |z 9781627081023 | ||
| 020 | |a 9781627081030 |q (electronic bk.) | ||
| 035 | |a (MiAaPQ)5004392496 | ||
| 035 | |a (Au-PeEL)EBL4392496 | ||
| 035 | |a (CaPaEBR)ebr11160634 | ||
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| 050 | 4 | |a TK7871 |b .A86 2015 | |
| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (41st : |d 2015 : |c Portland, Oregon), |j organizer. | |
| 245 | 1 | 0 | |a ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : |b November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA / |c organized by ISTFA/2015, Electronic Device Failure Analysis Society (EDFAS), ASM International. |
| 264 | 1 | |a Materials Park, Ohio : |b ASM International, |c [2015] | |
| 264 | 4 | |c 2015 | |
| 300 | |a 1 online resource (536 pages) : |b illustrations (some color) | ||
| 336 | |a text |2 rdacontent | ||
| 337 | |a computer |2 rdamedia | ||
| 338 | |a online resource |2 rdacarrier | ||
| 500 | |a Cover title. | ||
| 588 | |a Description based on online resource; title from PDF title page (ebrary, viewed March 14, 2016). | ||
| 590 | |a Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries. | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 650 | 0 | |a Semiconductors |x Testing |v Congresses. | |
| 655 | 4 | |a Electronic books. | |
| 710 | 2 | |a ASM International, |e organizer. | |
| 710 | 2 | |a Electronic Device Failure Analysis Society, |e organizer. | |
| 797 | 2 | |a ProQuest (Firm) | |
| 856 | 4 | 0 | |u https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=4392496 |z Click to View |