ISTFA 2014 : : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /

ISTFA 2014 : : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / / organized by Electronic Device Failure Analysis Society, ASM International.

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International Symposium for Testing and Failure Analysis Houston, Tex.)
TeilnehmendeR:
Electronic Device Failure Analysis Society,
ASM International,
Place / Publishing House:Materials Park, Ohio : : ASM International,, 2014.
2014
Year of Publication:2014
Language:English
Online Access:
Physical Description:1 online resource (560 pages) :; color illustrations, photographs
Notes:Includes index.
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id 5003002486
ctrlnum (MiAaPQ)5003002486
(Au-PeEL)EBL3002486
(CaPaEBR)ebr10998999
(OCoLC)929147993
collection bib_alma
record_format marc
spelling International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.)
ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / organized by Electronic Device Failure Analysis Society, ASM International.
Materials Park, Ohio : ASM International, 2014.
2014
1 online resource (560 pages) : color illustrations, photographs
text rdacontent
computer rdamedia
online resource rdacarrier
Includes index.
Description based on online resource; title from PDF title page (ebrary, viewed January 9, 2014).
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Electronics Materials Testing Congresses.
Electronic apparatus and appliances Testing Congresses.
Electronic books.
Electronic Device Failure Analysis Society, organizer.
ASM International, organizer.
Print version: International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.) ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA. Materials Park, Ohio : ASM International, c2014 xx, 540 pages 9781627080743
ProQuest (Firm)
https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=3002486 Click to View
language English
format Conference Proceeding
eBook
author2 Electronic Device Failure Analysis Society,
ASM International,
author_facet Electronic Device Failure Analysis Society,
ASM International,
International Symposium for Testing and Failure Analysis Houston, Tex.)
author2_role TeilnehmendeR
TeilnehmendeR
author_corporate International Symposium for Testing and Failure Analysis Houston, Tex.)
author_sort International Symposium for Testing and Failure Analysis Houston, Tex.)
title ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
spellingShingle ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
title_sub conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
title_full ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / organized by Electronic Device Failure Analysis Society, ASM International.
title_fullStr ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / organized by Electronic Device Failure Analysis Society, ASM International.
title_full_unstemmed ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / organized by Electronic Device Failure Analysis Society, ASM International.
title_auth ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
title_new ISTFA 2014 :
title_sort istfa 2014 : conference proceedings from the 40th international symposium for testing and failure analysis ; november 9-13, 2014, george r. brown conversion center, houston, texas, usa /
publisher ASM International,
publishDate 2014
physical 1 online resource (560 pages) : color illustrations, photographs
isbn 9781627080750
9781627080743
callnumber-first T - Technology
callnumber-subject TK - Electrical and Nuclear Engineering
callnumber-label TK7871
callnumber-sort TK 47871 I884 42014
genre Electronic books.
genre_facet Congresses.
Electronic books.
url https://ebookcentral.proquest.com/lib/oeawat/detail.action?docID=3002486
illustrated Illustrated
dewey-hundreds 600 - Technology
dewey-tens 620 - Engineering
dewey-ones 621 - Applied physics
dewey-full 621.381
dewey-sort 3621.381
dewey-raw 621.381
dewey-search 621.381
oclc_num 929147993
work_keys_str_mv AT internationalsymposiumfortestingandfailureanalysishoustontex istfa2014conferenceproceedingsfromthe40thinternationalsymposiumfortestingandfailureanalysisnovember9132014georgerbrownconversioncenterhoustontexasusa
AT electronicdevicefailureanalysissociety istfa2014conferenceproceedingsfromthe40thinternationalsymposiumfortestingandfailureanalysisnovember9132014georgerbrownconversioncenterhoustontexasusa
AT asminternational istfa2014conferenceproceedingsfromthe40thinternationalsymposiumfortestingandfailureanalysisnovember9132014georgerbrownconversioncenterhoustontexasusa
status_str n
ids_txt_mv (MiAaPQ)5003002486
(Au-PeEL)EBL3002486
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is_hierarchy_title ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
author2_original_writing_str_mv noLinkedField
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